一款高压LED芯片的设计和制造工艺

一款高压LED芯片的设计和制造工艺

六块掩模版的图样

A.MESA

B.TCL

C. ISO isolation

D. MB metal bridge

E.PW

F.SiO2 passivation

8-25次试验一片1.MESA- ICP 6min

parameter

Base

ICP

Cl

Ar

Pressure

value

80

120

30

30

0.60Pa

Fig.1 The picture of wafer etched by ICP in 6 min.

The average thickness of SiO2 Hard Mask: 6671 Å

The MESA average depth after ICP: 12400 Å

Fig. 2 Photograph of remove SiO2 mask. Rough wafer 45 sec., smooth wafer 50 sec..

2.TCL

The thickness of ITO is about 250 nm.

Fig. 3 etched ITO four minutes

3.ISO

Fig. 4 Etched 30 minutes using ICP

Fig. 5 Remove SiO2(1um) after ICP 40 minutes

The graphic pattern of the wafer inclined to one side in this step.

最终芯片外观,然后激光切割。

该技术的难点是小chip之间需要完全刻蚀独立,然后用金电极串联,如何让电极跨越高深度的鸿沟而不出现悬空和断线。

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